Journal of Applied Measurement. Volume 1, Number 3.

Development of a Scale for Measuring Invasive Plant Environmentalism. Edward W. Wolfe and Hallie Dozier

Factorial Modeling of Differential Distractor Functioning in Multiple-Choice Items. Wen-Chung Wang

Measurement of Cognitive Performance in Computer Programming Concept Acquisition: Interactive Effects of Visual Metaphors and the Cognitive Style Construct. Elspeth McKay

CAT Administration of Language Placement Examinations. John Stahl, Betty Bergstrom, and Richard Gershon

Understanding Rasch Measurement: Metric Development and Score Reporting in Rasch Measurement. Everett V. Smith, Jr.

If you have not seen the Journal, please e-mail your request for a sample copy. Instructors: sample copies of the Journal are available for your students. To subscribe to the Journal of Applied Measurement (individual, $40/year; institutional, $100/year; foreign, add $28/year), contact:

Richard M. Smith, Editor
Journal of Applied Measurement
P.O. Box 143186, Gainesville, FL 32614
(352) 392-6524, editor@jampress.org

To Journal of Applied Measurement"

Journal of Applied Measurement 1:3. Smith, R.M. … Rasch Measurement Transactions, 2000, 14:2 p.745




Rasch Publications
Rasch Measurement Transactions (free, online) Rasch Measurement research papers (free, online) Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch Applying the Rasch Model 3rd. Ed., Bond & Fox Best Test Design, Wright & Stone
Rating Scale Analysis, Wright & Masters Introduction to Rasch Measurement, E. Smith & R. Smith Introduction to Many-Facet Rasch Measurement, Thomas Eckes Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, George Engelhard, Jr. Statistical Analyses for Language Testers, Rita Green
Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar Journal of Applied Measurement Rasch models for measurement, David Andrich Constructing Measures, Mark Wilson Rasch Analysis in the Human Sciences, Boone, Stave, Yale
in Spanish: Análisis de Rasch para todos, Agustín Tristán Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez

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