Journal of Applied Measurement

Volume 3, Number 1. Spring 2002

A Confirmatory Study of Rasch-based Optimal Categorization of a Rating Scale. Weimo Zhu.

Dimensionality and Construct Validity of School Development Expectation Scale for Secondary Students. Mo Ching Magdalena Mok and Marcellin Flynn.

Item Grouping Effects on Invariance of Attitude Items. Catherine Frantom, Kathy E. Green, and Tony C.M. Lam.

Level of Activity in Profound/Sever Mental Retardation (LAPMER): A Rasch-derived Scale of Disability. Luigi Tesio, Maria Rosa Valsecchi, Marina Sala, Paolo Guzzon, and Mario Alberto Battaglia

Understanding Rasch Measurement: Optimizing Rating Scale Category Effectiveness. John M. Linacre.

Back-issues available: $10. each. Instructors: sample copies of the Journal are available for your students. To subscribe, (individual, $40/year; institutional, $100/year; foreign, add $28/year), contact:

Richard M. Smith, Editor
Journal of Applied Measurement
P.O. Box 15171, Sacramento, CA 95851
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Journal of Applied Measurement. Volume 3, Number 1. Spring 2002. Smith R.M. … 15:4 p. 855

Journal of Applied Measurement. Volume 3, Number 1. Spring 2002. Smith R.M. … Rasch Measurement Transactions, 2002, 15:4 p. 855

Rasch Publications
Rasch Measurement Transactions (free, online) Rasch Measurement research papers (free, online) Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch Applying the Rasch Model 3rd. Ed., Bond & Fox Best Test Design, Wright & Stone
Rating Scale Analysis, Wright & Masters Introduction to Rasch Measurement, E. Smith & R. Smith Introduction to Many-Facet Rasch Measurement, Thomas Eckes Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, George Engelhard, Jr. Statistical Analyses for Language Testers, Rita Green
Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar Journal of Applied Measurement Rasch models for measurement, David Andrich Constructing Measures, Mark Wilson Rasch Analysis in the Human Sciences, Boone, Stave, Yale
in Spanish: Análisis de Rasch para todos, Agustín Tristán Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez

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