"Access, Provocation, and the Development of Professional Identity:Celebrating the Careers of Benjamin D. Wright."
Celebrate Ben Wright with friends and colleagues through 1) platform presentations; 2) poster presentations, roundtables, and "artifact" displays; and 3) a social event (Saturday evening, 26 April).The conference will close by early afternoon on Sunday. The program is coming together nicely with commitments from many of Ben's closest colleagues and students, but it is not too late to send in presentation proposals. Those intending to be there should go to www.rasch.org to obtain, print, and fax/mail/email in a free registration form so we have some idea of how many will be showing up.
April 19-20, Saturday-Sunday
An Introduction To Rasch Measurement: Theory And Applications.
Workshop at the University of Illinois at Chicago conducted by Everett V. Smith Jr. and Richard M. Smith. www.jampress.org
April 21-25, Monday-Friday
AERA Annual Meeting. www.aera.net
April 25-27, Friday-Sunday
Ben Wright Festschrift. www.rasch.org
April 28-29, Monday-Tuesday
Facets Workshop, CORE, Evanston www.winsteps.com/seminar.htm
April 30-May 1, Wednesday-Thursday
Winsteps Workshop, CORE, Evanston www.winsteps.com/seminar.htm
This Training Session will be presented at the University of Illinois at Chicago immediately before the AERA Annual Meeting in Chicago. The workshop will be conducted by Everett V. Smith Jr., PhD (University of Illinois at Chicago) and Richard M. Smith, PhD (Educational Data Systems). Registration information is available from Everett Smith at www.jampress.org Fee: $250.00 ($100 for students with proof of student status).
Registration deadline: April 1, 2003
Workshop Description: The purpose of this training session is to introduce participants to the theory and applications of Rasch measurement and provide hands-on experience using Rasch calibration programs to scale ordinal data. This session will provide participants with the necessary tools to become effective consumers of research employing Rasch measurement and the skills necessary to solve practical measurement problems. Instructional material will be based on four Rasch measurement models: dichotomous, rating scale, partial credit, and many-facet data. Participants will have the opportunity to use current Rasch software. The format will consist of eight self-contained units. The units are: Introduction to Rasch Measurement; Item and Person Calibration; Dichotomous and Polytomous Data; Performance and Judged Data; Applications of Rasch Measurement I and II; Examples of Rasch Analysis; and Analysis of Participants Data. The co-directors will divide the topics in each session to maximize individual strengths. The instructional format will combine lecture, question and answer, and small group instruction.
Saturday, April 19, 2003
8:30 am Registration and Coffee/Juice/Danishes/Muffins
Session I. Introduction to Rasch Measurement
9:00 Welcome: Richard M. Smith
9:05 What is Measurement: Richard M. Smith
9:30 Rasch Measurement Models: Everett V. Smith, Jr.
10:00 True Score vs. Rasch Measurement Models: Everett V. Smith, Jr.
Session II. Item and Person Calibration
10:45 Testing the Fit of Data: Richard M. Smith
11:30 Dimensionality and PC Analysis of Residuals: Everett V. Smith, Jr.
12:00 pm Lunch Break
Session III. Dichotomous and Polytomous Data
1:30 WINSTEPS Control Language: Everett V. Smith, Jr.
2:00 Small Group Calibration Projects:
Group 1 Dichotomous Data. Richard M. Smith
Group 2 Polytomous Data. Everett V. Smith, Jr.
Session IV. Performance and Judged Data
3:15 FACETS Control Language: Richard M. Smith
3:45 Small Group Calibration Projects
Group 1 Nested Data (ratings of conference proposals). Richard M. Smith
Group 2 Fully Crossed Data (ratings of student performance). Everett V. Smith, Jr.
4:30 End of Day One
5:30 Optional group dinner
Sunday, April 20, 2003
8:30 am Coffee/Juice/Danishes/Muffins
Session V. Applications of Rasch Measurement
9:00 Score Reporting: Everett V. Smith, Jr.
9:25 Standard Setting: Everett V. Smith, Jr.
9:50 Item Bias : Richard M. Smith
Session VI. Applications of Rasch Measurement
10:45 Test Equation and Item Banking: Richard M. Smith
11:15 Computer Adaptive Testing: Richard M. Smith
11:45 Rasch vs. Multi-Parameter IRT Models: Everett V. Smith, Jr.
12:00 pm Lunch Break
Session VII. Examples of Rasch Analysis
1:30 Rating Scale Data: Everett V. Smith, Jr.
2:00 Partial Credit Data: Richard M. Smith
Session VIII. Analysis of Participants Data
3:00 Running WINSTEPS and FACETS: Everett V. Smith, Jr., Richard M. Smith
3:30 Your turn to analyze data: Participants interested in analyzing their own data should bring a laptop with Windows 95 (or newer), 8 MB RAM (min), and Wordpad or Notepad.
4:30 End of Workshop
Exciting developments in the theory and practice of measurement in health, education, psychology and marketing provide an opportunity to review the state of the art in measurement science, learn from the experts in an extensive pre-conference program, and enjoy the delights of summer in Western Australia. Abstracts by August 31, 2003. For further information,
Ready for a little temptation? Has IOMW ever offered such lush
location? Try this:
the website for IOMW Down Under! None of the photos on the IOMW site are promo glossies; just snapshots I took one weekend. IOMW will have fun and substance! Many key folk in the Rasch measurement have undertaken to participate. The program already includes paper sessions, software workshops, networking opportunities, and SCUBA diving. This is the one you'll tell your grand-kids about!
Joseph Indorato, Operations Manager, is waiting to help you with your
accommodation requirements and is ready to take those early
Joe is willing to help you share an apartment if you give him the appropriate information. Remember to mention the magic code IOMW when booking/enquiring. Quest Inns also has accommodation all round Australia for those who want to make the most of the visit.
Trevor Bond, Chair IOMW XII Committee
Rasch-related Conferences and Workshops, 2003-2004 Rasch Measurement Transactions, 2003, 16:4 p.894ff.
|Rasch Measurement Transactions (free, online)||Rasch Measurement research papers (free, online)||Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch||Applying the Rasch Model 3rd. Ed., Bond & Fox||Best Test Design, Wright & Stone|
|Rating Scale Analysis, Wright & Masters||Introduction to Rasch Measurement, E. Smith & R. Smith||Introduction to Many-Facet Rasch Measurement, Thomas Eckes||Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, George Engelhard, Jr.||Statistical Analyses for Language Testers, Rita Green|
|Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar||Journal of Applied Measurement||Rasch models for measurement, David Andrich||Constructing Measures, Mark Wilson||Rasch Analysis in the Human Sciences, Boone, Stave, Yale|
|in Spanish:||Análisis de Rasch para todos, Agustín Tristán||Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez|
|Forum||Rasch Measurement Forum to discuss any Rasch-related topic|
Go to Top of Page
Go to index of all Rasch Measurement Transactions
AERA members: Join the Rasch Measurement SIG and receive the printed version of RMT
Some back issues of RMT are available as bound volumes
Subscribe to Journal of Applied Measurement
Go to Institute for Objective Measurement Home Page. The Rasch Measurement SIG (AERA) thanks the Institute for Objective Measurement for inviting the publication of Rasch Measurement Transactions on the Institute's website, www.rasch.org.
|Coming Rasch-related Events|
|June 23 - July 21, 2023, Fri.-Fri.||On-line workshop: Practical Rasch Measurement - Further Topics (E. Smith, Winsteps), www.statistics.com|
|Aug. 11 - Sept. 8, 2023, Fri.-Fri.||On-line workshop: Many-Facet Rasch Measurement (E. Smith, Facets), www.statistics.com|
The URL of this page is www.rasch.org/rmt/rmt164n.htm