Journal of Applied Measurement
Volume 5, Number 2. Summer 2004

The Impact of Model Misfit on Partial Credit Model Parameter Estimates, Randall D. Penfield, p. 115-128

Calibrating the Genome, Nathan J. Markward and William P. Fisher, Jr., p. 129-141

Comparisons of Mathematics Achievement of Grade 8 Students in the United States and the Russian Federation, Saodat I. Bazarova and George Engelhard, Jr., p. 142-159

A Rasch Analysis of Three of the Wisconsin Scales of Psychosis Proneness: Measurement of Schizotypy, Roger E. Graves and Sara Weinstein, p. 160-171

Evaluation of the 0.3 Logits Screening Criterion in Common Item Equating, G. Edward Miller, Ourania Rotou, and Jon S. Twing, p. 172-177

The Effect of Dropping Low Ability Scores on Ability Estimates, Ryan P. Bowles, p. 178-188

Understanding Rasch Measurement: Detecting and Measuring Rater Effects using Many-facet Rasch Measurement: Part II, Carol M. Myford and Edward V. Wolfe, p. 189-227

Richard M. Smith, Editor
Journal of Applied Measurement
P.O. Box 1283, Maple Grove, MN 55311
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Journal of Applied Measurement 5:2, Smith R.M. … Rasch Measurement Transactions, 2004, 17:4 p.958

Rasch Publications
Rasch Measurement Transactions (free, online) Rasch Measurement research papers (free, online) Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch Applying the Rasch Model 3rd. Ed., Bond & Fox Best Test Design, Wright & Stone
Rating Scale Analysis, Wright & Masters Introduction to Rasch Measurement, E. Smith & R. Smith Introduction to Many-Facet Rasch Measurement, Thomas Eckes Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, George Engelhard, Jr. Statistical Analyses for Language Testers, Rita Green
Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar Journal of Applied Measurement Rasch models for measurement, David Andrich Constructing Measures, Mark Wilson Rasch Analysis in the Human Sciences, Boone, Stave, Yale
in Spanish: Análisis de Rasch para todos, Agustín Tristán Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez

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