Proposals for papers, symposia and other presentations are invited via the on-line submissions system of the American Educational Research Association: www.aera.net
All SIG proposals must be submitted by 11:59 p.m. (Pacific Time) on August 3, 2004. The Rasch SIG program chair, Trevor Bond, invites members to volunteer as session chairs, discussants and reviewers through the on-line submission system.
If you have already had experience at presenting in a Rasch SIG session at AERA, you might consider offering your Rasch-informed paper to another SIG or Division. I can personally assure you that the Survey Research in Education SIG would actively welcome Rasch based survey research papers to that SIG.
The RM SIG has the opportunity to use round-table sessions for non-paper presentations. Software demonstrations and expert-led discussions of beginners' problems have been suggested. Any volunteers or ideas?
Trevor Bond, Rasch Measurement SIG Program Chair
I hope that those of you who attended this year's annual AERA meeting in San Diego had a successful conference and made it back home safely. There were a number of very interesting papers presented at the sessions sponsored by the Rasch SIG. Thanks to all who attended and presented at these sessions!
Elections were held at the SIG Annual Business Meeting held during the AERA Annual Meeting, and the following officers were elected:
Randy Schumacker, University of North Texas
Steve Stemler, Yale University
Trevor Bond, James Cook University
John Michael Linacre has graciously agreed to continuing serving as the Newsletter editor. He asked me to remind SIG members that the current and back-issues of Rasch Measurement Transactions (RMT) can be downloaded from www.rasch.org/rmt/
I would like to encourage all AERA members to join the Rasch SIG (if you haven't yet). Membership in the SIG is critically important as the number of paper presentation slots allocated by AERA is solely determined by the number of paid members of the SIG. So, in order to ensure that we have a quality program for Montreal next year, we encourage everyone to make sure that they are SIG members, and to encourage others who may be interested to join as well.
1. Loge onto the members only site of AERA:
2. Once you are logged in, choose the option that says "Join a special interest group".
3. Check the box next to the Rasch Measurement SIG (83). If you have already paid your dues, the box will be grayed out so can't select it - that is one way to check your status.
4. Charge the $10 dues to your credit card using AERA's secure website, and voila!, you are a full-fledged SIG member.
Secretary, Rasch Measurement SIG
Assistant Director, PACE Center, Yale University
On about April 1st, 2003 - the opening account balance for the last year - the balance was $454.62.
On January 29th, 2004 - the closing account balance for my tenure as SIG secretary - the balance was $908.28.
Currently, the only pending charge to the SIG is the July 2004 SIG-payable dues to AERA, which will equal $100. This is $50 less than in previous years. In 2004, AERA will increase SIG individual membership dues by $5 per year.
Total: 198. AERA 143 (72%), SIG only 55 (28%)
Edward W. Wolfe - April 2004
August 5, 2004 - Thursday
Introductory Winsteps workshop, Chicago
conducted by Ken Conrad and Nick Bezruczko
October 11-12 & 13-14, 2004 - Monday-Thursday
Winsteps and Facets workshops, Durham NC
conducted by John Michael Linacre
RMT 18:1 Summer 2004 Announcements, Rasch Measurement Transactions, 2004, 18:1 p.960
|Rasch Measurement Transactions (free, online)||Rasch Measurement research papers (free, online)||Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch||Applying the Rasch Model 3rd. Ed., Bond & Fox||Best Test Design, Wright & Stone|
|Rating Scale Analysis, Wright & Masters||Introduction to Rasch Measurement, E. Smith & R. Smith||Introduction to Many-Facet Rasch Measurement, Thomas Eckes||Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, George Engelhard, Jr.||Statistical Analyses for Language Testers, Rita Green|
|Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar||Journal of Applied Measurement||Rasch models for measurement, David Andrich||Constructing Measures, Mark Wilson||Rasch Analysis in the Human Sciences, Boone, Stave, Yale|
|in Spanish:||Análisis de Rasch para todos, Agustín Tristán||Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez|
|Forum||Rasch Measurement Forum to discuss any Rasch-related topic|
Go to Top of Page
Go to index of all Rasch Measurement Transactions
AERA members: Join the Rasch Measurement SIG and receive the printed version of RMT
Some back issues of RMT are available as bound volumes
Subscribe to Journal of Applied Measurement
Go to Institute for Objective Measurement Home Page. The Rasch Measurement SIG (AERA) thanks the Institute for Objective Measurement for inviting the publication of Rasch Measurement Transactions on the Institute's website, www.rasch.org.
|Coming Rasch-related Events|
|Jan. 25 - March 8, 2023, Wed..-Wed.||On-line course: Introductory Rasch Analysis (M. Horton, RUMM2030), medicinehealth.leeds.ac.uk|
|Apr. 11-12, 2023, Tue.-Wed.||International Objective Measurement Workshop (IOMW) 2023, Chicago, IL. iomw.net|
|June 23 - July 21, 2023, Fri.-Fri.||On-line workshop: Practical Rasch Measurement - Further Topics (E. Smith, Winsteps), www.statistics.com|
|Aug. 11 - Sept. 8, 2023, Fri.-Fri.||On-line workshop: Many-Facet Rasch Measurement (E. Smith, Facets), www.statistics.com|
The URL of this page is www.rasch.org/rmt/rmt181k.htm