November 6-7, 2004 Chicago, IL
The purpose of this training session is to introduce participants to the theory and applications of Rasch measurement and provide hands-on experience using Rasch calibration programs to scale ordinal data. This session will provide participants with the necessary tools to become effective consumers of research employing Rasch measurement and the skills necessary to solve practical measurement problems. Instructional material will be based on four Rasch measurement models: dichotomous, rating scale, partial credit, and many-facet data. Participants will have the opportunity to use current Rasch software. Directors: Everett V. Smith Jr. and
Richard M. Smith.
The format will consist of eight self-contained units. The units are: Introduction to Rasch Measurement; Item and Person Calibration; Dichotomous and Polytomous Data; Performance and Judged Data; Applications of Rasch Measurement I and II; Examples of Rasch Analyses; and Analysis of Participants Data. The co-directors will divide the topics in each session to maximize individual strengths. The instructional format will combine lecture, question and answer, and small group instruction.
Registration includes the full 2-day workshop, a continental and bagel bar breakfast each morning, over 800 pages of handouts and tutorial material, a copy of Introduction to Rasch Measurement (a 698 page book) and a one-year subscription to the Journal of Applied Measurement. More details are at www.jampress.org Audience: Anyone interested in learning about the practical aspects of Rasch measurement. Previous training in measurement is recommended, but not necessary.
Location: Chicago Circle Center (CCC) building on the campus of the University of Illinois at Chicago. The CCC is located at 750 South Halstead Street, Chicago.
Agenda: Saturday, November 6, 2004
Session I - Introduction to Rasch Measurement: What is Measurement, Rasch Measurement Models, True Score vs. Rasch Measurement Models.
Session II - Item and Person Calibration: Testing the Fit of Data, Dimensionality and PC Analysis of Residuals.
Session III - Dichotomous and Polytomous Data: WINSTEPS Control Language, Example of dichotomous data analysis, Example of polytomous data analysis.
Session IV - Performance and Judged Data: FACETS Control Language & example of facets analysis with nested data (ratings of conference proposals), Example of facets analysis and G-Theory (ratings of student performance).
Group dinner (optional)
Sunday, November 7, 2004
Session V - Applications of Rasch Measurement: Score Reporting, Standard Setting, Item Bias.
Session VI - Applications of Rasch Measurement: Test Equating and Item Banking, Computer Adaptive Testing, Rasch vs. Multi-Parameter IRT Models.
Session VII - Examples of Rasch Analyses: Rating Scale Data, Partial Credit Data.
Session VIII - Analysis of Participants: Running WINSTEPS and FACETS, Other Rasch software: RUMM, Conquest, MULTIRA, WINMIRA, and LPCM-WIN, Your turn to analyze data.
Workshop: An Introduction to Rasch Measurement: Theory and Applications, Smith E. V. & Smith R. M. Rasch Measurement Transactions, 2004, 18:2 p.983
|Rasch Measurement Transactions (free, online)||Rasch Measurement research papers (free, online)||Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch||Applying the Rasch Model 3rd. Ed., Bond & Fox||Best Test Design, Wright & Stone|
|Rating Scale Analysis, Wright & Masters||Introduction to Rasch Measurement, E. Smith & R. Smith||Introduction to Many-Facet Rasch Measurement, Thomas Eckes||Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, George Engelhard, Jr.||Statistical Analyses for Language Testers, Rita Green|
|Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar||Journal of Applied Measurement||Rasch models for measurement, David Andrich||Constructing Measures, Mark Wilson||Rasch Analysis in the Human Sciences, Boone, Stave, Yale|
|in Spanish:||Análisis de Rasch para todos, Agustín Tristán||Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez|
|Forum||Rasch Measurement Forum to discuss any Rasch-related topic|
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Go to index of all Rasch Measurement Transactions
AERA members: Join the Rasch Measurement SIG and receive the printed version of RMT
Some back issues of RMT are available as bound volumes
Subscribe to Journal of Applied Measurement
Go to Institute for Objective Measurement Home Page. The Rasch Measurement SIG (AERA) thanks the Institute for Objective Measurement for inviting the publication of Rasch Measurement Transactions on the Institute's website, www.rasch.org.
|Coming Rasch-related Events|
|Oct. 6 - Nov. 3, 2023, Fri.-Fri.||On-line workshop: Rasch Measurement - Core Topics (E. Smith, Facets), www.statistics.com|
|Oct. 12, 2023, Thursday 5 to 7 pm Colombian time||On-line workshop: Deconstruyendo el concepto de validez y Discusiones sobre estimaciones de confiabilidad SICAPSI (J. Escobar, C.Pardo) www.colpsic.org.co|
|June 12 - 14, 2024, Wed.-Fri.||1st Scandinavian Applied Measurement Conference, Kristianstad University, Kristianstad, Sweden http://www.hkr.se/samc2024|
|Aug. 9 - Sept. 6, 2024, Fri.-Fri.||On-line workshop: Many-Facet Rasch Measurement (E. Smith, Facets), www.statistics.com|
The URL of this page is www.rasch.org/rmt/rmt182f.htm