Papers in Honour of John P. Keeves
Series: Education in the Asia-Pacific Region: Issues, Concerns and Prospects, Vol. 4, 2005
Alagumalai, Sivakumar; Curtis, David D.; Hungi, Njora (Eds.)
1 - Classical Test Theory (CTT); Sivakumar Alagumalai and David Curtis
2 - Objective measurement; Geoff Masters
3 - The Rasch model explained; David Andrich
4 - Monitoring mathematics achievement over time; Tilahun Mengesha Afrassa
5 - Manual and automatic estimates of growth and gain across year levels: How close is close? Petra Lietz and Dieter Kotte
6 - Japanese language learning and the Rasch model; Kazuyo Taguchi
7 - Chinese language learning and the Rasch model; Ruilan Yuan
8 - Applying the Rasch model to detect biased items; Njora Hungi
9 - Raters and examinations; Steven Barrett
10 - Comparing classical and contemporary analyses and Rasch measurement; David Curtis
11 - Combining Rasch scaling and Multi-level analysis; Murray Thompson
12 - Rasch and attitude scales: Explanatory Style; Shirley Yates
13 - Science teachers' views on science, technology and society issues; Debra Tedman
14 - Estimating the complexity of workplace rehabilitation task using Rasch analysis; Ian Blackman
15 - Creating a scale as a general measure of satisfaction for information and communications technology users; I Gusti Ngurah Darmawan
16 - Multidimensional item responses: Multimethod-multitrait perspectives; Mark Wilson and Machteld Hoskens
17 - Information functions for the general dichotomous unfolding model; Luo Guanzhong and David Andrich
18 - Past, present and future: an idiosyncratic view of Rasch measurement; Trevor Bond
Epilogue - Our Experiences and Conclusion; Sivakumar Alagumalai, David Curtis and Njora Hungi
Appendix IRT Software - Descriptions and Student Versions
The website mentioned on the back cover of the book does not exist.
Applied Rasch Measurement: A Book of Exemplars. Alagumalai S., Curtis D.D., Hungi N. (Eds.) Rasch Measurement Transactions, 2005, 19:2 p. 1024
Forum | Rasch Measurement Forum to discuss any Rasch-related topic |
Go to Top of Page
Go to index of all Rasch Measurement Transactions
AERA members: Join the Rasch Measurement SIG and receive the printed version of RMT
Some back issues of RMT are available as bound volumes
Subscribe to Journal of Applied Measurement
Go to Institute for Objective Measurement Home Page. The Rasch Measurement SIG (AERA) thanks the Institute for Objective Measurement for inviting the publication of Rasch Measurement Transactions on the Institute's website, www.rasch.org.
Coming Rasch-related Events | |
---|---|
Oct. 4 - Nov. 8, 2024, Fri.-Fri. | On-line workshop: Rasch Measurement - Core Topics (E. Smith, Winsteps), www.statistics.com |
Jan. 17 - Feb. 21, 2025, Fri.-Fri. | On-line workshop: Rasch Measurement - Core Topics (E. Smith, Winsteps), www.statistics.com |
May 16 - June 20, 2025, Fri.-Fri. | On-line workshop: Rasch Measurement - Core Topics (E. Smith, Winsteps), www.statistics.com |
June 20 - July 18, 2025, Fri.-Fri. | On-line workshop: Rasch Measurement - Further Topics (E. Smith, Facets), www.statistics.com |
Oct. 3 - Nov. 7, 2025, Fri.-Fri. | On-line workshop: Rasch Measurement - Core Topics (E. Smith, Winsteps), www.statistics.com |
The URL of this page is www.rasch.org/rmt/rmt192h.htm
Website: www.rasch.org/rmt/contents.htm