Your Invitation to "A Tribute to Benjamin D. Wright"


Please join us for a tribute to Benjamin D. Wright
When: Saturday, March 28, 2009 6:00 PM
Where: the Wyndham Chicago
633 N Saint Clair St
Chicago, Ilinois 60611
Details: No-host dinner
Cost: $45 per person
RSVP: By March 18, 2009

Benjamin D. Wright celebrates his 83rd birthday on March 30. The measurement community celebrates his lifetime of achievements on Saturday, March 28, 2009.
Dr. Wright has published more than 150 papers on Rasch measurement, co-authored 12 books, and directed the development of the two most widely used Rasch measurement computer programs. His leadership in the field is unparalleled, and many of his students are contemporary leaders in psychometrics.

The evening will consist of informal speeches and a photo slide show to commemorate Dr. Wright. Moderators and speakers include Ed Bouchard, Allen Heinemann, Nikolaus Bezrucko, and many others.

Ben Wright will speak at the celebratory Symposium: "Improving Efficiency in Health Outcome Measurement", Chicago, Saturday, March 28, 2009.

Your Invitation to "A Tribute to Benjamin D. Wright", Rasch Measurement Transactions, 2009, 22:4, 1175



Rasch Publications
Rasch Measurement Transactions (free, online) Rasch Measurement research papers (free, online) Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch Applying the Rasch Model 3rd. Ed., Bond & Fox Best Test Design, Wright & Stone
Rating Scale Analysis, Wright & Masters Introduction to Rasch Measurement, E. Smith & R. Smith Introduction to Many-Facet Rasch Measurement, Thomas Eckes Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, George Engelhard, Jr. Statistical Analyses for Language Testers, Rita Green
Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar Journal of Applied Measurement Rasch models for measurement, David Andrich Constructing Measures, Mark Wilson Rasch Analysis in the Human Sciences, Boone, Stave, Yale
in Spanish: Análisis de Rasch para todos, Agustín Tristán Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez

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