The Rasch Measurement SIG will offer our membership meeting/invited address and three paper sessions at this year's AERA Annual Meeting in Boston.
The membership meeting on Tuesday, April 17, will feature talks by Barry McGaw, Australian Council of Educational Research, and Benjamin Wright, University of Chicago. Barry McGaw's Rasch scaling for monitoring and reporting on educational systems is based on his experiences with Rasch measurement of educational achievement in Australia. Ben Wright's Differences between scores and measures will be an expansion of the research notes that have appeared in RMT.
The first paper session on Monday, April 16, is on Partial Credit and Rating Scale applications. Two papers by Barbara Dodd and William Koch report on computerized adaptive testing with the Partial Credit model. Two other papers look at applications of the Rating Scale model to measurement, one on pastoral care by William Fisher, the second on ethical sensitivity in computer use by Sue Leibowitz. The final paper by Robert Gable is on the use of Rating Scale residuals to analyze item structure and person characteristics.
The second paper session, Rasch Measurement: Past and Future on Friday, April 20, combines two presentations on the history of Rasch measurement by David Andrich and George Engelhard, Jr. with two presentations about future applications by Mary Lunz and John Michael Linacre.
The third session on Friday, April 20, focuses on dichotomous applications of Rasch measurement. Two papers by Philip Westfall and Richard Smith are on the use of Rasch person fit analysis to improve the predictive validity of test scores. The other two papers are on the application of the Rasch model to tests of irony in poetry by Michael Smith and the application of the Saltus model to a Piagetian test of cognitive development by Karen Ekstrand.
Richard M. Smith
1990 AERA Program (Rasch SIG). Smith RM. Rasch Measurement Transactions, 1990, 3:4 p.81
|Rasch Measurement Transactions (free, online)||Rasch Measurement research papers (free, online)||Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch||Applying the Rasch Model 3rd. Ed., Bond & Fox||Best Test Design, Wright & Stone|
|Rating Scale Analysis, Wright & Masters||Introduction to Rasch Measurement, E. Smith & R. Smith||Introduction to Many-Facet Rasch Measurement, Thomas Eckes||Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, George Engelhard, Jr.||Statistical Analyses for Language Testers, Rita Green|
|Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar||Journal of Applied Measurement||Rasch models for measurement, David Andrich||Constructing Measures, Mark Wilson||Rasch Analysis in the Human Sciences, Boone, Stave, Yale|
|in Spanish:||Análisis de Rasch para todos, Agustín Tristán||Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez|
|Forum||Rasch Measurement Forum to discuss any Rasch-related topic|
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Go to index of all Rasch Measurement Transactions
AERA members: Join the Rasch Measurement SIG and receive the printed version of RMT
Some back issues of RMT are available as bound volumes
Subscribe to Journal of Applied Measurement
Go to Institute for Objective Measurement Home Page. The Rasch Measurement SIG (AERA) thanks the Institute for Objective Measurement for inviting the publication of Rasch Measurement Transactions on the Institute's website, www.rasch.org.
|Coming Rasch-related Events|
|June 23 - July 21, 2023, Fri.-Fri.||On-line workshop: Practical Rasch Measurement - Further Topics (E. Smith, Winsteps), www.statistics.com|
|Aug. 11 - Sept. 8, 2023, Fri.-Fri.||On-line workshop: Many-Facet Rasch Measurement (E. Smith, Facets), www.statistics.com|
The URL of this page is www.rasch.org/rmt/rmt34h.htm