Saturday, April 10
8:30-10:30 Session 1: Measurement Practice Chair: G.Engelhard
"Generally objective" measures of NAEP writing data J.Stenner
Attitudes toward educational experience D.Tatum, L.Webster
Youth leadership instrument W.Zhu, C.Ruhm
Evaluating portfolio assessment C.Myford
Home environment changes J.Monsaas, G.Engelhard
Change in functional performance L.Ludlow, S.Haley
Equivalence of a readiness test in two languages S.Lang
11:00-12:00 Session 2: Linear Programming and Test Equating Chair: B.Wright
0-1 linear programming for observed-score equating W.van der Linden
Interface for linear programming test construction E.Boekooi-Timminga
Item component equating R.Smith
1:00-2:30 Session 3: Computer Adaptive Tests Chair: W.van der Linden
Comparability of written and CAT tests G.Stone, M.Lunz
Design of adaptive tests and testlets M.Berger
Item selection strategies for math CAT R.Carlson, H.Suen
Parallel Raven items M.Sanchez, W.Koch
3:00-5:00 Session 4: Random Coefficient Multinomial Logits (RCML) Family
RCML Family M.Wilson
Applying RCML to item bias detection S.Moore
Multiple-choice and performance-based items W.Wang, M.Wilson
RCML investigation of linear logistic test models K.Draney, P.Pirolli, M.Wilson
Multilevel RCML model R.Adams, M.Wilson
Parameter recovery and two level RCML M.Wu, R.Adams
Sunday, April 11
8:30-10:30 Session 5: Measurement Theory Chair: D.Andrich
What makes people feel lonely LLTM analysis E.Roskam
Evaluation, assessment, measurement F.Shaw
Real-time cognitive process measurement R.Jannarone
Compensatory model for simultaneous cut scores H.Vos
Unfolding analysis J.Linacre
Construction of meaning B.Wright
11:00-12:00 Session 6: Analysis of Rating Scales Chair: M.Wilson
Dichotomization of graded responses D.Andrich
Threshold location B.Sheridan
Continuous data P.Pedler
Successive intervals B.Dodd, W.Koch
1:00-2:30 Session 7: Unidimensionality and Differential Item Functioning Chair: R.Smith
Multidimensional scaling for unidimensionality T-H.Chen, M.Davison
Logistic-regression for unidimensionality R.Anderson
Comparison of item bias detection methods S.Luppescu
W, B and Sato Caution Indices A.D'Costa
Sex bias in science achievement D.Young
3:00-5:00 Session 8: Measurement Application Chair: J.Monsaas
Measuring voting behavior F.Cerda
Effect of demographic variables R.Wilk
Student outcomes assessment R.Bruce
Primary reading tests T.K.Lim
Predicting academic performance C.Morrison
Selecting candidates for raters P.Alvarez
School leaving mathematics examination F.Shaw
Seventh International Objective Measurement Workshop
IOMW7 meets on April 10-11, 1993, Emory University (206 White Hall), just before AERA, April 12-16, in Atlanta. Measurement theorists and practitioners from the United States, Australia, the Netherlands, Singapore, South Africa, and Spain will attend.
Most convenient lodging is Emory Inn (404-712-6700, 800-933-6679) with shuttle bus to Emory University. IOMW7 group rate is $62. per room (single, double or triple - share and save!). The AERA conference hotels (Educational Researcher, Nov. 1992) are one-hour by public transport (MARTA) or 30 minutes by taxi from Emory. There are shuttle vans from Atlanta airport to Emory Inn or downtown.
Saturday Night Dinner: We plan to go to a nearby restaurant. If you want to join our party, let us know immediately.
Objective Measurement: Theory into Practice III. Editors, George Engelhard and Mark Wilson, ask that IOMW7 papers intended for publication in this volume be submitted before or at IOMW7.
Profs. George Engelhard, Jr & Judith A. Monsaas
IOMW7 Co-Chairs
Educational Studies, 201 Fishburne Building
Emory University, Atlanta GA 30322
Tel. (404) 727-0607, FAX (404) 727-2799
IOMW7 Program. … Rasch Measurement Transactions, 1993, 6:4 p. 248
| Rasch Publications | ||||
|---|---|---|---|---|
| Rasch Measurement Transactions (free, online) | Rasch Measurement research papers (free, online) | Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch | Applying the Rasch Model 3rd. Ed., Bond & Fox | Best Test Design, Wright & Stone |
| Rating Scale Analysis, Wright & Masters | Introduction to Rasch Measurement, E. Smith & R. Smith | Introduction to Many-Facet Rasch Measurement, Thomas Eckes | Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, George Engelhard, Jr. | Statistical Analyses for Language Testers, Rita Green |
| Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar | Journal of Applied Measurement | Rasch models for measurement, David Andrich | Constructing Measures, Mark Wilson | Rasch Analysis in the Human Sciences, Boone, Stave, Yale |
| in Spanish: | Análisis de Rasch para todos, Agustín Tristán | Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez | ||
| Forum | Rasch Measurement Forum to discuss any Rasch-related topic |
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AERA members: Join the Rasch Measurement SIG and receive the printed version of RMT
Some back issues of RMT are available as bound volumes
Subscribe to Journal of Applied Measurement
Go to Institute for Objective Measurement Home Page. The Rasch Measurement SIG (AERA) thanks the Institute for Objective Measurement for inviting the publication of Rasch Measurement Transactions on the Institute's website, www.rasch.org.
| Coming Rasch-related Events | |
|---|---|
| June 23 - July 21, 2023, Fri.-Fri. | On-line workshop: Practical Rasch Measurement - Further Topics (E. Smith, Winsteps), www.statistics.com |
| Aug. 11 - Sept. 8, 2023, Fri.-Fri. | On-line workshop: Many-Facet Rasch Measurement (E. Smith, Facets), www.statistics.com |
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