Friday, May 21, 1993, Chicago
Computer-adaptive vs. Written Item Difficulty
Gregory E. Stone, Amer Soc Clin Pathologists
Predicting from Measures
Tony Pitruzello, Measurement Consultant
Computerized Clinical Simulation Testing
Anna Bersky, Nat Coun State Boards Nursing
Hair Outcomes and Marketing Procedures
Thomas K. Rehfeldt, Helene Curtis Inc.
Effect of Ability on DIF
Betty Bergstrom, Richard Gershon, CAT Inc.
William L. Brown, Minneapolis Public Schools
Measurement when N = 1 !
Jack Stenner, Computerland
Many-facet Rasch and Generalizability Theory
John Michael Linacre, MESA
Robustness: Greek vs. Babylonian Approaches
William P. Fisher, Jr., Marianjoy Hospital
Factorial-Rasch Approach to DIF
Huixing Tang, The Psychological Corporation
Toward a Definition of Employee Involvement
David E. Drehmer, James A. Belohlav, Ray W. Coye, De Paul University
Effects of Altering Item Position
Merv Brennan, Yi Du, Illinois State Bd of Ed
Measurement Quality of LORS-III
Livia Magalhaes, Craig Velozo, Ay-wan Pan, University of Illinois at Chicago
Useful Rater Disagreement: None or Some?
Carol Kelly, Marianjoy Rehabilitation Hospital
Does Norm-referenced Testing have a Future?
Barb Davis, Eaton Schools
Dennis Wisniewski, Michigan State Bd of Educ
Rasch Measurement Transactions, 1993, 7:1, 269
Mid-West Objective Measurement Workshop, May 1993. Rasch Measurement Transactions, 1993, 7:1, 269
Rasch Publications | ||||
---|---|---|---|---|
Rasch Measurement Transactions (free, online) | Rasch Measurement research papers (free, online) | Probabilistic Models for Some Intelligence and Attainment Tests, Georg Rasch | Applying the Rasch Model 3rd. Ed., Bond & Fox | Best Test Design, Wright & Stone |
Rating Scale Analysis, Wright & Masters | Introduction to Rasch Measurement, E. Smith & R. Smith | Introduction to Many-Facet Rasch Measurement, Thomas Eckes | Invariant Measurement: Using Rasch Models in the Social, Behavioral, and Health Sciences, George Engelhard, Jr. | Statistical Analyses for Language Testers, Rita Green |
Rasch Models: Foundations, Recent Developments, and Applications, Fischer & Molenaar | Journal of Applied Measurement | Rasch models for measurement, David Andrich | Constructing Measures, Mark Wilson | Rasch Analysis in the Human Sciences, Boone, Stave, Yale |
in Spanish: | Análisis de Rasch para todos, Agustín Tristán | Mediciones, Posicionamientos y Diagnósticos Competitivos, Juan Ramón Oreja Rodríguez |
Forum | Rasch Measurement Forum to discuss any Rasch-related topic |
Go to Top of Page
Go to index of all Rasch Measurement Transactions
AERA members: Join the Rasch Measurement SIG and receive the printed version of RMT
Some back issues of RMT are available as bound volumes
Subscribe to Journal of Applied Measurement
Go to Institute for Objective Measurement Home Page. The Rasch Measurement SIG (AERA) thanks the Institute for Objective Measurement for inviting the publication of Rasch Measurement Transactions on the Institute's website, www.rasch.org.
Coming Rasch-related Events | |
---|---|
June 23 - July 21, 2023, Fri.-Fri. | On-line workshop: Practical Rasch Measurement - Further Topics (E. Smith, Winsteps), www.statistics.com |
Aug. 11 - Sept. 8, 2023, Fri.-Fri. | On-line workshop: Many-Facet Rasch Measurement (E. Smith, Facets), www.statistics.com |
The URL of this page is www.rasch.org/rmt/rmt71c.htm
Website: www.rasch.org/rmt/contents.htm