Question: An item "Discrimination Index" is shown in Wright & Stone's book, Best Test
Design (1979, p. 52), but is not described in detail. What is it? Is it useful?
K. L., Hong Kong
Answer: This Discrimination Index was a feature of the Rasch computer program, BICAL. It is described in MESA Research Memorandum, 23B, by B.D. Wright, R.J. Mead, & S.R. Bell, June 1979. Here is what is written on pages 15 and 16:
If the data ... produced characteristic curves which varied in slope, then the person-item logit could be expressed as
(21) |
or
(22) |
where
In this form, γni is the difference between a "true" logit response and the Rasch model with which we have attempted to explain it. If the Rasch model adequately accounts for the data, the regression in Equation 22 should have a slope of zero.
In terms of estimates, this expression can be written as
(23) |
[but yni can be approximated from the Rasch ICC as]
Therefore an indication of αi can be calculated as
[where y.i is the mean of the residuals for item i, and m.i is the mean of the person-item logits, bn-di.]
This is the residual index given in BICAL output.
Comment: Item discrimination is conceptualized as a property of the central slope of the item characteristic curve (ICC). This index, however, is strongly influenced by outliers (e.g., lucky guesses, careless mistakes). This drawback might be overcome by dropping or down-weighting off-target responses. On the other hand, Wright & Stone (p. 53) claim this index to be less affected by sample targeting and dispersion than the point-biserial correlation.
Discrimination, Guessing and Carelessness Asymptotes: Estimating IRT Parameters with Rasch.
Linacre J.M. Rasch Measurement Transactions, 2004, 18:1 p.959-960BICAL item discrimination index. Wright BD, Mead RJ, Bell SR. Rasch Measurement Transactions, 2002, 16:1 p.869
Forum | Rasch Measurement Forum to discuss any Rasch-related topic |
Go to Top of Page
Go to index of all Rasch Measurement Transactions
AERA members: Join the Rasch Measurement SIG and receive the printed version of RMT
Some back issues of RMT are available as bound volumes
Subscribe to Journal of Applied Measurement
Go to Institute for Objective Measurement Home Page. The Rasch Measurement SIG (AERA) thanks the Institute for Objective Measurement for inviting the publication of Rasch Measurement Transactions on the Institute's website, www.rasch.org.
Coming Rasch-related Events | |
---|---|
Oct. 4 - Nov. 8, 2024, Fri.-Fri. | On-line workshop: Rasch Measurement - Core Topics (E. Smith, Winsteps), www.statistics.com |
Jan. 17 - Feb. 21, 2025, Fri.-Fri. | On-line workshop: Rasch Measurement - Core Topics (E. Smith, Winsteps), www.statistics.com |
May 16 - June 20, 2025, Fri.-Fri. | On-line workshop: Rasch Measurement - Core Topics (E. Smith, Winsteps), www.statistics.com |
June 20 - July 18, 2025, Fri.-Fri. | On-line workshop: Rasch Measurement - Further Topics (E. Smith, Facets), www.statistics.com |
Oct. 3 - Nov. 7, 2025, Fri.-Fri. | On-line workshop: Rasch Measurement - Core Topics (E. Smith, Winsteps), www.statistics.com |
The URL of this page is www.rasch.org/rmt/rmt161n.htm
Website: www.rasch.org/rmt/contents.htm